真理光學儀器有限公司專注于顆粒表征儀器的研發和制造，產品涵蓋激光（衍射法）粒度分析儀、動態光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀，既有實驗室儀器，又有在線檢測系統。真理光學秉持“科學態度，工匠精神”，為用戶提供粒度產品和服務。
真理光學匯集了以張福根博士為代表的全國顆粒表征領域的人才。張福根博士現任本公司董事長兼首席科學家，還擔任全國顆粒表征及分檢與篩網標準化技術委員會副主任委員、天津大學兼職教授，曾擔任中國顆粒學會副理事長，同時也是“歐美克”字號公司的創始人。曾擔任英國某粒度儀器公司中國總經理20余年的秦和義先生擔任本公司商務總經理，中國顆粒學會青年理事潘林超博士、陳進博士擔綱公司的研發主力。
激光（衍射法）粒度儀雖然已得到廣泛應用，但是在很多方面還存在需要改進的地方，不論是科學基礎方面，還是技術方案方面。真理光學的團隊針對當前市面上儀器存在的不足，展開了系統的理論研究和技術創新，發現了衍射光斑（愛里斑）的反常變化現象（ACAD），解釋了為什么不能測量3μm左右的聚苯乙烯微球，并給出了反常區（不能測量粒徑）的一般公式；研究了衍射儀器的測量上限和下限；研究了顆粒折射率偏差對測量結果的影響，發明了兩種根據散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術方案，解決了前向超大角測量盲區的問題，使衍射儀器的亞微米顆粒測量水平得到提高;提出了統一的反演算法（專有技術），消除了不同計算模式給出不同結果的尷尬；設計出了高達20Kfps的超高速并行數據采樣電路，使干法測量的精度不亞于濕法測量，對高速噴霧場的測量（時間）分辨率也更高。
在納米粒度及Zeta電位儀方面，真理光學提出了比相位分析法（PALS）更先進的余弦擬合相位分析法（CF-PALS），用光纖分束取代了傳統的平板分束鏡分束，用光纖內光干涉取代了自由空間干涉，使Zeta電位的測量重復性大幅度提高。
Linkoptik Instruments specializes in the R&D and manufacturing of particle characterization instruments. Its product portfolio includes laser diffraction particle size analyzers, dynamic light scattering nanoparticle size & zeta potential analyzers, and particle image analyzers, covering both laboratory instruments and online monitoring systems. Adhering to the spirit of “Scientific Attitude and Craftsmanship”, Linkoptik Instruments provides customers with professional particle sizing products and services.
Linkoptik Instruments has brought together top professionals in China’s particle characterization field, led by Dr. Zhang Fugen. Dr. Zhang Fugen currently serves as Chairman and Chief Scientist of the company. He is also Vice Chairman of the National Technical Committee for Standardization of Particle Characterization, Sizing and Sieves, an adjunct professor at Tianjin University, former Vice President of the Chinese Society of Particuology, and founder of the “Oumike (OMEC)” brand.
Mr. Qin Heyi, who served as China General Manager of a British particle size instrument company for more than 20 years, acts as Commercial General Manager of Linkoptik Instruments. Dr. Pan Linchao and Dr. Chen Jin, both young council members of the Chinese Society of Particuology, serve as core members of the company’s R&D team.
Although laser diffraction particle size analyzers have been widely used, they still have room for improvement in both fundamental science and technical design.
Targeting the limitations of existing instruments on the market, the R&D team of Linkoptik Instruments has carried out systematic theoretical research and technological innovation:
- Discovered the Abnormal Change of Airy Diffraction pattern (ACAD), explained the difficulty in accurately measuring polystyrene microspheres around 3 μm, and derived a general formula for the invalid measurement size range;
- Studied the upper and lower measurement limits of laser diffraction instruments;
- Investigated the influence of particle refractive index deviation on measurement results, and developed two methods for estimating particle refractive index based on scattered light distribution;
- Proposed an inclined trapezoidal window design to eliminate the large forward-angle measurement blind zone, greatly improving sub-micron particle measurement performance;
- Developed a proprietary unified inversion algorithm that removes inconsistencies among results from different calculation models;
- Designed an ultra-high-speed parallel data acquisition circuit up to 20,000 fps, enabling dry measurement to achieve accuracy comparable to wet measurement, with higher temporal resolution for high-speed spray field analysis.
For nanoparticle size and zeta potential analyzers, Linkoptik Instruments proposed Cosine Fitting Phase Analysis Light Scattering (CF?PALS), a more advanced technique than conventional Phase Analysis Light Scattering (PALS). By replacing traditional beam-splitting mirrors with fiber optic beam splitting and replacing free-space interference with in-fiber optical interference, the measurement repeatability of zeta potential has been significantly improved.
